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Predicting and eliminating built-in test false alarms
Rosenthal, D.; Wadell, B.C.; Reliability, IEEE Transactions on Volume 39, Issue 4, Oct. 1990 Page(s):500 - 505 Modeling circuit parasitics. 1
Wadell, B.C.; Instrumentation & Measurement Magazine, IEEE Volume 1, Issue 1, March 1998 Page(s):31 - 33 Modeling circuit parasitics. II
Wadell, B.C.; Instrumentation & Measurement Magazine, IEEE Volume 1, Issue 2, June 1998 Page(s):6 - 8 Modeling circuit parasitics. 3
Wadell, B.C.; Instrumentation & Measurement Magazine, IEEE Volume 1, Issue 3, Sept. 1998 Page(s):28 - 29, 31 Modeling circuit parasitics. IV
Wadell, B.C.; Instrumentation & Measurement Magazine, IEEE Volume 1, Issue 4, Dec. 1998 Page(s):36 - 38 Smith charts are easy. I
Wadell, B.C.; Instrumentation & Measurement Magazine, IEEE Volume 2, Issue 1, March 1999 Page(s):37 - 40 Smith charts are easy. II
Wadell, B.C.; Instrumentation & Measurement Magazine, IEEE Volume 2, Issue 2, June 1999 Page(s):45 - 47 Smith charts are easy. III
Wadell, B.C.; Instrumentation & Measurement Magazine, IEEE Volume 2, Issue 3, Sep 1999 Page(s):38 - 42 Review of "Microwave and RF Circuits: Analysis, Synthesis and Design by Max Medley, Jr."
Antennas and Propagation Magazine, IEEE
Vol. 35, No. 4, August 1993, Page(s):48
Cruising the Cambridge Technology Mall
Wadell, Brian C.;
Instrumentation and Measurement Magazine, IEEE
1995, Page(s): 6-8.
Panel Discussion - Extending the Frontiers of Space Measurement
Wadell, Brian C.; Schmalzel, John; Fowler, Kim; Zoughi, Reza; Instrumentation and Measurement Technology Conference Proceedings, 2007 IEEE 1-3 May 2007 Page(s):v - v |